2026-09-19T16:24:59Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1125292022-01-13T07:54:05Zcom_1721.1_7582com_1721.1_7581col_1721.1_131024
Kamal Youcef-Toumi.
Yu, Jennifer, S.B. Massachusetts Institute of Technology
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Massachusetts Institute of Technology. Department of Mechanical Engineering
2017-12-05T19:16:57Z
2017-12-05T19:16:57Z
2017
2017
http://hdl.handle.net/1721.1/112529
1012939866
Thesis: S.B., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2017.
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 71-72).
In this thesis, I present the design and implementation of a novel cantilever probe holder that is capable of tapping mode operation. The probe holder is implemented in a previously designed high-speed, large-range atomic force microscope (AFM). This AFM used a cantilever probe holder that was only capable of contact mode operation, placing limitations on imaging speed and increasing the risk of probe tip damage. Therefore, the focus of this thesis presents the improved design of a cantilever probe holder that actuates and utilizes probe dynamics. This will allow for more flexible and sustainable use of the AFM system. Additionally, two versions of this improved design are developed for operation in air and in liquid. Classical plate theory, finite element analysis (FEA), and non-parametric system identification are used to validate the structure dynamics of the cantilever probe holder.
by Jennifer Yu.
S.B.
72 pages
eng
Massachusetts Institute of Technology
MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.
http://dspace.mit.edu/handle/1721.1/7582
Mechanical Engineering.
Design and implementation of cantilever probe holder for tapping mode atomic force microscopy
Thesis
application/pdf
false
Publication
unknown
unknown
<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="746eeac1-431a-4ce3-8550-64662df43ee4">
<Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type>
<Language>eng</Language>
<Title>Design and implementation of cantilever probe holder for tapping mode atomic force microscopy</Title>
<PublishedIn>
<Publication>
</Publication>
</PublishedIn>
<PublicationDate>2017</PublicationDate>
<Authors>
<Author>
<DisplayName>Yu, Jennifer, S.B. Massachusetts Institute of Technology</DisplayName>
<Affiliation>
<OrgUnit>
</OrgUnit>
</Affiliation>
</Author>
</Authors>
<Editors>
</Editors>
<Publishers>
<Publisher>
<DisplayName>Massachusetts Institute of Technology</DisplayName>
<OrgUnit />
</Publisher>
</Publishers>
<License>http://dspace.mit.edu/handle/1721.1/7582</License>
<Keyword>Mechanical Engineering.</Keyword>
<Abstract>In this thesis, I present the design and implementation of a novel cantilever probe holder that is capable of tapping mode operation. The probe holder is implemented in a previously designed high-speed, large-range atomic force microscope (AFM). This AFM used a cantilever probe holder that was only capable of contact mode operation, placing limitations on imaging speed and increasing the risk of probe tip damage. Therefore, the focus of this thesis presents the improved design of a cantilever probe holder that actuates and utilizes probe dynamics. This will allow for more flexible and sustainable use of the AFM system. Additionally, two versions of this improved design are developed for operation in air and in liquid. Classical plate theory, finite element analysis (FEA), and non-parametric system identification are used to validate the structure dynamics of the cantilever probe holder.</Abstract>
<Access xmlns="http://purl.org/coar/access_right"
>
</Access>
</Publication>