2026-09-22T06:54:24Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/115112022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Rafael Reif.
Tsai, Julie Ann
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2005-08-17T19:08:27Z
2005-08-17T19:08:27Z
1995
1995
http://hdl.handle.net/1721.1/11511
33669043
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
Includes bibliographical references (p. 177-187).
by Julie Ann Tsai.
Ph.D.
187 p.
15866075 bytes
15865830 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Deposition and characterization of silicon-germanium alloy thin films on oxide
Thesis
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