<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-20T06:52:43Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/115774" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/115774</identifier><datestamp>2026-06-16T18:55:26Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131022</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Martin C. Rinard.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Long, Fan, Ph. D. Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2018-05-23T16:34:14Z</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2018</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2018</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/115774</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">1036987605</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2018.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 285-296).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Automatic patch generation holds out the promise of automatically correcting software defects without the need for developers to manually diagnose, understand, and correct these defects. This dissertation presents two novel patch generation systems, Prophet and Genesis, which learn from past successful human patches to enhance the patch generation process. The core of Prophet and Genesis is a novel learning technique that extracts universal properties of correct code and a novel inference technique that generalizes universal patching strategies across different applications. The results show that the learning and inference techniques enable Prophet and Genesis to operate with rich and tractable search spaces that contain many useful patches and efficient search algorithms that prioritize correct patches. By collectively leveraging development efforts worldwide, Prophet and Genesis automatically generate correct patches for real-world defects in large open-source C and Java applications with up to millions lines of code.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Fan Long.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">Ph.D.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">296 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Automatic patch generation via learning from successful human patches</dim:field>
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   	&lt;Title>Automatic patch generation via learning from successful human patches&lt;/Title>
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   	&lt;PublicationDate>2018&lt;/PublicationDate>
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        	&lt;DisplayName>Long, Fan, Ph. D. Massachusetts Institute of Technology&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>Automatic patch generation holds out the promise of automatically correcting software defects without the need for developers to manually diagnose, understand, and correct these defects. This dissertation presents two novel patch generation systems, Prophet and Genesis, which learn from past successful human patches to enhance the patch generation process. The core of Prophet and Genesis is a novel learning technique that extracts universal properties of correct code and a novel inference technique that generalizes universal patching strategies across different applications. The results show that the learning and inference techniques enable Prophet and Genesis to operate with rich and tractable search spaces that contain many useful patches and efficient search algorithms that prioritize correct patches. By collectively leveraging development efforts worldwide, Prophet and Genesis automatically generate correct patches for real-world defects in large open-source C and Java applications with up to millions lines of code.&lt;/Abstract>
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