2026-09-19T14:59:20Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/120622022-01-27T16:54:00Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
John V. Guttag, Michael A. Cusumano.
Crandall, William W
Massachusetts Institute of Technology. Department of Electrical Engineering
Sloan School of Management
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-08-16T22:14:13Z
2005-08-16T22:14:13Z
1994
1994
http://hdl.handle.net/1721.1/12062
31449395
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994
Includes bibliographical references (leaves 129-136).
by William Wofford Crandall, Jr.
M.S.
136 leaves
11120813 bytes
11120574 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Sloan School of Management
Electrical Engineering
Metrics for measuring the value of computer integrated manufacturing (CIM) systems
Thesis
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