2026-09-20T05:00:22Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1217442021-07-05T14:03:20Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Karl K. Berggren.
Turchetti, Marco.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2019-07-17T20:59:55Z
2019-07-17T20:59:55Z
2019
2019
https://hdl.handle.net/1721.1/121744
1102051291
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 103-108).
In this thesis, the different electron optical components necessary to build a linear cavity for multi-pass transmission electron microscopy are analyzed and simulated. Moreover, a prototype of the core component, the gated mirror, was designed and some preliminary experimental testings were carried out to asses its optical properties. Then, an architecture of the complete linear cavity, including the correction of spherical aberration and image rotation was designed, optimized and validated through simulation. Finally, an experimental setup for the characterization of electron optical elements was also designed, implemented and experimentally tested. Such a diagnostics setup is going to be adopted for the verification of the multi-pass components optical properties, performance, and their agreement to the design specifications.
by Marco Turchetti.
S.M.
S.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science
108 pages
eng
Massachusetts Institute of Technology
MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Design of a linear cavity and a characterization setup for multi-pass transmission electron microscopy
Thesis
application/pdf
2019-07-17T20:59:53Z
Publication
Master
EECS
unknown
unknown
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