<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-18T20:34:30Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/124233" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/124233</identifier><datestamp>2026-06-06T00:56:00Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Michael Siegel.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Bhamidipati, Sravya(Sravya M.)</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2020-03-24T15:35:33Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2020-03-24T15:35:33Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2019</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2019</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">https://hdl.handle.net/1721.1/124233</dim:field>
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   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019</dim:field>
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   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 63-71).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">As technology's societal influence continues to grow, cyber risk management is becoming a serious priority. Individuals are putting their important assets and personal data, such as social security numbers, passwords, medical history, and more into the cloud. As a result, security breaches pose a drastic threat. To properly address this, rigorous risk management needs to be in place, and it is a well-known adage that you can not manage what you can not measure. This thesis first shows that there is room in the industry for better quantitative cyber risk measurement and then provides an assessment of current players that are trying to approach this issue. As one solution to the problem, a Failure Modes and Effects Analysis is performed on well-known cybersecurity breaches to provide common failure modes, causes, and effects within an organization. Cyber risk must be evaluated quantitatively in order to effectively approach it.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Sravya Bhamidipati.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="collection" lang="en_US">M.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">71 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">MIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Examining approaches to quantifying cyber risk for improved cybersecurity management</dim:field>
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   	&lt;Title>Examining approaches to quantifying cyber risk for improved cybersecurity management&lt;/Title>
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   	&lt;Abstract>As technology&amp;apos;s societal influence continues to grow, cyber risk management is becoming a serious priority. Individuals are putting their important assets and personal data, such as social security numbers, passwords, medical history, and more into the cloud. As a result, security breaches pose a drastic threat. To properly address this, rigorous risk management needs to be in place, and it is a well-known adage that you can not manage what you can not measure. This thesis first shows that there is room in the industry for better quantitative cyber risk measurement and then provides an assessment of current players that are trying to approach this issue. As one solution to the problem, a Failure Modes and Effects Analysis is performed on well-known cybersecurity breaches to provide common failure modes, causes, and effects within an organization. Cyber risk must be evaluated quantitatively in order to effectively approach it.&lt;/Abstract>
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