2026-09-24T08:02:45Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/127622022-01-13T07:54:35Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
David H. Staelin and Roy E. Welsch.
Lee, Deishin
Sloan School of Management
Massachusetts Institute of Technology. Department of Mechanical Engineering
2005-08-15T18:29:14Z
2005-08-15T18:29:14Z
1992
1992
http://hdl.handle.net/1721.1/12762
27030749
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.
Includes bibliographical references (leaf 59).
by Deishin Lee.
M.S.
76 leaves
5673357 bytes
5673114 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Mechanical Engineering
Sloan School of Management
Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool
Thesis
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