<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-22T18:43:05Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/132798" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/132798</identifier><datestamp>2026-08-04T07:58:08Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor">Steven B. Leeb.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Saathoff, Erik K.
            (Erik Karl)</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2021-10-08T16:47:58Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2021-10-08T16:47:58Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2021</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2021</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">https://hdl.handle.net/1721.1/132798</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">1262873708</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, February, 2021</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from the official PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 195-198).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">An inrush transient contains extensive information that permits load identification, condition monitoring, and line impedance estimation. A power system monitor's (PSM) ability to identify a load based on its inrush behavior depends on the training exemplars used to create and optimize the load identification algorithm. This work discusses the use a phase-controlled switch that can be used in situ to integrate the effects of source and line impedance into the inrush data, and to generate transients at controllable turn-on phase angles relative to the voltage line-cycle. The resulting exemplars are more realistic than those generated with conventional techniques such as testing with an AC power supply. The control over angle also enables efficient investigation of a load's transient variability space. Testing loads in fault conditions expands the variability space, allowing load identification algorithms to correctly identify faulty loads and perform diagnostics. The large, high-frequency current that inrush transients inject into the line provides excellent excitation for line impedance estimation. Previous switching based approaches focus on fitting the line impedance to a model, i.e. parametric impedance estimation. This thesis extends previous work by providing the current excitation with common electrical loads rather than using capacitors, inductors, and short circuits. Non-parametric impedance estimation is also demonstrated. Inrush transients, and other transients generated by switching the load on and off rapidly, generate current with wide-bandwidth spectral content to replace previously used sinusoidal injection sweeps.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Erik K. Saathoff.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="collection" lang="en_US">S.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">198 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Inrush transient generation and line impedance estimation</dim:field>
   <dim:field mdschema="dc" element="type" lang="en_US">Thesis</dim:field>
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   <dim:field mdschema="mit" element="thesis" qualifier="degree" lang="en_US">Master</dim:field>
   <dim:field mdschema="mit" element="thesis" qualifier="department" lang="en_US">EECS</dim:field>
   <dim:field mdschema="others" element="access-status">unknown</dim:field>
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   	&lt;Title>Inrush transient generation and line impedance estimation&lt;/Title>
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   	&lt;PublicationDate>2021&lt;/PublicationDate>
   	&lt;Authors>
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        	&lt;DisplayName>Saathoff, Erik K.
            (Erik Karl)&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>An inrush transient contains extensive information that permits load identification, condition monitoring, and line impedance estimation. A power system monitor&amp;apos;s (PSM) ability to identify a load based on its inrush behavior depends on the training exemplars used to create and optimize the load identification algorithm. This work discusses the use a phase-controlled switch that can be used in situ to integrate the effects of source and line impedance into the inrush data, and to generate transients at controllable turn-on phase angles relative to the voltage line-cycle. The resulting exemplars are more realistic than those generated with conventional techniques such as testing with an AC power supply. The control over angle also enables efficient investigation of a load&amp;apos;s transient variability space. Testing loads in fault conditions expands the variability space, allowing load identification algorithms to correctly identify faulty loads and perform diagnostics. The large, high-frequency current that inrush transients inject into the line provides excellent excitation for line impedance estimation. Previous switching based approaches focus on fitting the line impedance to a model, i.e. parametric impedance estimation. This thesis extends previous work by providing the current excitation with common electrical loads rather than using capacitors, inductors, and short circuits. Non-parametric impedance estimation is also demonstrated. Inrush transients, and other transients generated by switching the load on and off rapidly, generate current with wide-bandwidth spectral content to replace previously used sinusoidal injection sweeps.&lt;/Abstract>
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