2026-09-19T00:24:22Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/136362022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Carl V. Thompson.
Cho, Jaeshin
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2005-08-10T22:31:04Z
2005-08-10T22:31:04Z
1990
1990
http://hdl.handle.net/1721.1/13636
24250277
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1990.
Includes bibliographical references (leaves 210-222).
by Jaeshin Cho.
Ph.D.
222 leaves
13226483 bytes
13226236 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Effect of microstructure of aluminum alloys on the electromigration-limited reliability of VLSI interconnects
Thesis
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