<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-18T23:18:39Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/141956" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/141956</identifier><datestamp>2022-04-20T03:01:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor">Welsch, Roy E.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="advisor">Boning, Duane S.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author">Tan, Aik Jun</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Sloan School of Management</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2022-04-19T19:59:49Z</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="issued">2021-06</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="submitted">2021-06-10T19:13:32.450Z</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">https://hdl.handle.net/1721.1/141956</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="orcid">https://orcid.org/0000-0001-5723-7015</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract">The 21st century has seen the remarkable transformation of machine vision by deep learning. This has enabled intelligent systems like autonomous vehicles and facial recognition software. However, the success of deep learning is largely predicated on the availability of sufficient data; in many instances, data may be scarce and expensive to source. In this thesis, we implemented two deep learning techniques: (1) inpainting using partial convolution and (2) generative adversarial network (GAN) to generate synthetic data to train deep learning image classifiers. We show that the addition of synthetic training images dramatically improved the accuracies of our defect classifiers. Using Gradient- Class Activation Map (Grad-CAM), we also demonstrate that the decision rules learned by the classifiers are significantly enhanced where the classifiers are accurately activating at the specific defect locations upon addition of synthetic training images. The study was performed at Amgen using real images of syringes and vials, indicating the practicality of the technique for industrial applications.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree">M.B.A.</dim:field>
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   <dim:field mdschema="dc" element="publisher">Massachusetts Institute of Technology</dim:field>
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   <dim:field mdschema="dc" element="title">Deep Learning Image Augmentation using Inpainting with Partial Convolution and GANs</dim:field>
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   <dim:field mdschema="thesis" element="degree" qualifier="name">Master of Business Administration</dim:field>
   <dim:field mdschema="thesis" element="degree" qualifier="name">Master of Science in Electrical Engineering and Computer Science</dim:field>
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   	&lt;Title>Deep Learning Image Augmentation using Inpainting with Partial Convolution and GANs&lt;/Title>
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   	&lt;PublicationDate>2021-06&lt;/PublicationDate>
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        	&lt;DisplayName>Tan, Aik Jun&lt;/DisplayName>
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   	&lt;Abstract>The 21st century has seen the remarkable transformation of machine vision by deep learning. This has enabled intelligent systems like autonomous vehicles and facial recognition software. However, the success of deep learning is largely predicated on the availability of sufficient data; in many instances, data may be scarce and expensive to source. In this thesis, we implemented two deep learning techniques: (1) inpainting using partial convolution and (2) generative adversarial network (GAN) to generate synthetic data to train deep learning image classifiers. We show that the addition of synthetic training images dramatically improved the accuracies of our defect classifiers. Using Gradient- Class Activation Map (Grad-CAM), we also demonstrate that the decision rules learned by the classifiers are significantly enhanced where the classifiers are accurately activating at the specific defect locations upon addition of synthetic training images. The study was performed at Amgen using real images of syringes and vials, indicating the practicality of the technique for industrial applications.&lt;/Abstract>
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