2026-09-18T19:49:18Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1570122024-09-25T04:04:39Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Perreault, David J.
Mondal, Neelambar
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2024-09-24T18:26:42Z
2024-09-24T18:26:42Z
2024-05
2024-07-11T14:37:25.078Z
https://hdl.handle.net/1721.1/157012
Automatic Test Equipment (ATE) systems require relays to perform complex high-speed tests on semiconductor devices. However, existing relays all come up short in some aspect. Electromechanical reed relays have a limited lifetime and slow switching speeds, while solid-state photoMOS relays have high on-resistance and low bandwidth. This thesis presents the design, simulation, and analysis of a new solid-state relay tailored for ATE applications. We use Analog Devices’ iCoupler technology to design this relay, relying on on-chip transformers to provide reliable input-to-output isolation. In Cadence simulations, the iCoupler relay achieves 100 mOhm on-resistance, 7.5 us turn-on time, and 4.8 GHz output 3dB bandwidth.
M.Eng.
Massachusetts Institute of Technology
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https://rightsstatements.org/page/InC-EDU/1.0/
Design and Analysis of a Transformer-Based Solid-State Relay
Thesis
application/pdf
Master
Master of Engineering in Electrical Engineering and Computer Science
Publication
unknown
unknown
<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="11d055f6-1180-485a-94a3-d3fa4d991429">
<Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type>
<Title>Design and Analysis of a Transformer-Based Solid-State Relay</Title>
<PublishedIn>
<Publication>
</Publication>
</PublishedIn>
<PublicationDate>2024-05</PublicationDate>
<Authors>
<Author>
<DisplayName>Mondal, Neelambar</DisplayName>
<Affiliation>
<OrgUnit>
</OrgUnit>
</Affiliation>
</Author>
</Authors>
<Editors>
</Editors>
<Publishers>
<Publisher>
<DisplayName>Massachusetts Institute of Technology</DisplayName>
<OrgUnit />
</Publisher>
</Publishers>
<License>https://rightsstatements.org/page/InC-EDU/1.0/</License>
<Abstract>Automatic Test Equipment (ATE) systems require relays to perform complex high-speed tests on semiconductor devices. However, existing relays all come up short in some aspect. Electromechanical reed relays have a limited lifetime and slow switching speeds, while solid-state photoMOS relays have high on-resistance and low bandwidth. This thesis presents the design, simulation, and analysis of a new solid-state relay tailored for ATE applications. We use Analog Devices’ iCoupler technology to design this relay, relying on on-chip transformers to provide reliable input-to-output isolation. In Cadence simulations, the iCoupler relay achieves 100 mOhm on-resistance, 7.5 us turn-on time, and 4.8 GHz output 3dB bandwidth.</Abstract>
<Access xmlns="http://purl.org/coar/access_right"
>
</Access>
</Publication>