2026-09-18T22:54:12Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/1626972025-09-19T04:49:09Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Schmitt, Tyler
Alizadeh, Mohammad
Choi, Sun Mee
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2025-09-18T14:27:51Z
2025-09-18T14:27:51Z
2025-05
2025-06-23T14:01:40.279Z
https://hdl.handle.net/1721.1/162697
The advancement of semiconductor manufacturing processes has allowed for the availability of powerful microcontrollers at lower costs, granting system designers the flexibility to select between analog and digital signal processing techniques. Enabled by recent developments in low-power successive approximation register (SAR) analog-to-digital converter (ADC) technology, a digital approach to root-mean-square (RMS) measurement is proposed. The work begins with an explicit accumulation and averaging approach, and a set of improvements were designed to increase measurement accuracy and reliability. Algorithms are compared using the metrics of error, power efficiency, latency, and digital overhead. High-performing and power-efficient digital RMS measurement methods could be valuable for decentralized instrumentation systems such as smart grids and factory automation where long-lasting handheld and portable solutions are becoming critical.
M.Eng.
Massachusetts Institute of Technology
In Copyright - Educational Use Permitted
Copyright retained by author(s)
https://rightsstatements.org/page/InC-EDU/1.0/
Application of Precision Successive-approximation-register
Analog-to-digital Converters for Digital Root-mean-square
Calculation
Thesis
application/pdf
Master
Master of Engineering in Electrical Engineering and Computer Science
Publication
unknown
unknown
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Analog-to-digital Converters for Digital Root-mean-square
Calculation</Title>
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<Abstract>The advancement of semiconductor manufacturing processes has allowed for the availability of powerful microcontrollers at lower costs, granting system designers the flexibility to select between analog and digital signal processing techniques. Enabled by recent developments in low-power successive approximation register (SAR) analog-to-digital converter (ADC) technology, a digital approach to root-mean-square (RMS) measurement is proposed. The work begins with an explicit accumulation and averaging approach, and a set of improvements were designed to increase measurement accuracy and reliability. Algorithms are compared using the metrics of error, power efficiency, latency, and digital overhead. High-performing and power-efficient digital RMS measurement methods could be valuable for decentralized instrumentation systems such as smart grids and factory automation where long-lasting handheld and portable solutions are becoming critical.</Abstract>
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