<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-18T17:25:42Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/162980" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/162980</identifier><datestamp>2026-01-16T20:08:01Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor">Pal, Ranjan</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="advisor">Siegel, Michael D.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author">Yao, Darren Z.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2025-10-06T17:37:57Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2025-10-06T17:37:57Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued">2025-05</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="submitted">2025-06-23T14:04:37.146Z</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">https://hdl.handle.net/1721.1/162980</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract">Modern software ecosystems are deeply interconnected, allowing a vulnerability in a single component to propagate and affect many others. In this thesis, we model software ecosystems as directed graphs, and apply various graph-theoretic metrics to quantify security risk. We compare two deep learning frameworks (PyTorch and TensorFlow) with two traditional software frameworks (npm and PyPI), identifying critical properties of their dependency structures, which motivates several recommendations for improving software supply chain security.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="publisher">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights">In Copyright - Educational Use Permitted</dim:field>
   <dim:field mdschema="dc" element="rights">Copyright retained by author(s)</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri">https://rightsstatements.org/page/InC-EDU/1.0/</dim:field>
   <dim:field mdschema="dc" element="title">Graph Metrics for Improving Cybersecurity on Software Dependency Networks</dim:field>
   <dim:field mdschema="dc" element="type">Thesis</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="mimetype">application/pdf</dim:field>
   <dim:field mdschema="mit" element="thesis" qualifier="degree">Master</dim:field>
   <dim:field mdschema="thesis" element="degree" qualifier="name">Master of Engineering in Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dspace" element="entity" qualifier="type">Publication</dim:field>
   <dim:field mdschema="others" element="access-status">unknown</dim:field>
   <dim:field mdschema="others" element="access-status">unknown</dim:field>
   <dim:field mdschema="cerif" element="openaire" authority="" confidence="-1">&lt;Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="215d523a-7111-4594-8caf-3baf3b521d12">
	&lt;Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843&lt;/Type>
   	&lt;Title>Graph Metrics for Improving Cybersecurity on Software Dependency Networks&lt;/Title>
   	&lt;PublishedIn>
    	&lt;Publication>
      	&lt;/Publication>
   	&lt;/PublishedIn>
   	&lt;PublicationDate>2025-05&lt;/PublicationDate>
   	&lt;Authors>
      	&lt;Author>
        	&lt;DisplayName>Yao, Darren Z.&lt;/DisplayName>
         	&lt;Affiliation>
         		&lt;OrgUnit>
         		&lt;/OrgUnit>
         	&lt;/Affiliation>
      	&lt;/Author>
	&lt;/Authors>
   	&lt;Editors>
	&lt;/Editors>
    &lt;Publishers>
        &lt;Publisher>
            &lt;DisplayName>Massachusetts Institute of Technology&lt;/DisplayName>
            &lt;OrgUnit />
        &lt;/Publisher>
    &lt;/Publishers>
    &lt;License>https://rightsstatements.org/page/InC-EDU/1.0/&lt;/License>
   	&lt;Abstract>Modern software ecosystems are deeply interconnected, allowing a vulnerability in a single component to propagate and affect many others. In this thesis, we model software ecosystems as directed graphs, and apply various graph-theoretic metrics to quantify security risk. We compare two deep learning frameworks (PyTorch and TensorFlow) with two traditional software frameworks (npm and PyPI), identifying critical properties of their dependency structures, which motivates several recommendations for improving software supply chain security.&lt;/Abstract>
	&lt;Access xmlns="http://purl.org/coar/access_right" 
    >
    &lt;/Access>
&lt;/Publication>
</dim:field>
</dim:dim>
</metadata></record></GetRecord></OAI-PMH>