<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T09:28:11Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/16891" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/16891</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Muriel Médard.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Lun, Desmond S. (Desmond Siu Men), 1979-</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2005-05-19T15:10:48Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2005-05-19T15:10:48Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2002</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2002</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/16891</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">51974125</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (leaves 43-45).</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author.  The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">We derive upper and lower bounds on the probability of error (the exponents of which are the error exponents) with "peaky" signaling -- the signaling strategy that achieves the capacity of the multipath fading channel under an average power constraint in the limit of infinite bandwidth. These bounds constitute a strong coding theorem for the channel as they not only delimit the range of achievable rates, but also give us a relationship among the error probability, data rate, bandwidth, "peakiness", and fading parameters such as the coherence time. They can be used to compare peaky signaling to other large bandwidth systems over fading channels, such as ultrawide band (UWB) radio and wideband CDMA. We first derive an upper bound for general fading, then specialize to the case of Rayleigh fading where we obtain upper and lower bounds that are exponentially tight and therefore yield the reliability function. We study the behavior of the reliability function and the upper and lower error probability bounds numerically.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Desmond S. Lun.</dim:field>
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   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Error exponents for multipath fading channels : a strong coding theorem</dim:field>
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   	&lt;Title>Error exponents for multipath fading channels : a strong coding theorem&lt;/Title>
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   	&lt;PublicationDate>2002&lt;/PublicationDate>
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        	&lt;DisplayName>Lun, Desmond S. (Desmond Siu Men), 1979-&lt;/DisplayName>
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   	&lt;Abstract>We derive upper and lower bounds on the probability of error (the exponents of which are the error exponents) with &amp;quot;peaky&amp;quot; signaling -- the signaling strategy that achieves the capacity of the multipath fading channel under an average power constraint in the limit of infinite bandwidth. These bounds constitute a strong coding theorem for the channel as they not only delimit the range of achievable rates, but also give us a relationship among the error probability, data rate, bandwidth, &amp;quot;peakiness&amp;quot;, and fading parameters such as the coherence time. They can be used to compare peaky signaling to other large bandwidth systems over fading channels, such as ultrawide band (UWB) radio and wideband CDMA. We first derive an upper bound for general fading, then specialize to the case of Rayleigh fading where we obtain upper and lower bounds that are exponentially tight and therefore yield the reliability function. We study the behavior of the reliability function and the upper and lower error probability bounds numerically.&lt;/Abstract>
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