2026-09-19T09:50:05Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/169432022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Vincent W.S. Chan and Muriel Médard.
Weichenberg, Guy E. (Guy Elli), 1978-
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-05-19T15:22:41Z
2005-05-19T15:22:41Z
2003
2003
http://hdl.handle.net/1721.1/16943
53245942
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.
Includes bibliographical references (p. 157-165).
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress.
by Guy E. Weichenberg.
S.M.
165 p.
900761 bytes
900510 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
High-reliability architectures for networks under stress
Thesis
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