2026-09-19T23:13:47Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/267222022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Donald E. Troxel and Carl V. Thompson.
Alam, Syed Mohiul, 1975-
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-09-06T19:49:12Z
2005-09-06T19:49:12Z
2004
2004
http://hdl.handle.net/1721.1/26722
59553725
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Includes bibliographical references (p. 195-204).
by Syed Mohiul Alam.
Ph.D.
204 p.
3195793 bytes
3262614 bytes
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application/pdf
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Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Design tool and methodologies for interconnect reliability analysis in integrated circuits
Thesis
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