2026-09-20T09:39:32Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/280852022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Frederick J. McGarry, Stephen D. Senturia.
Sikorski, Scott Anthony
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2005-09-26T18:24:03Z
2005-09-26T18:24:03Z
1994
1994
http://hdl.handle.net/1721.1/28085
31359546
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.
Includes bibliographical references (leaves 194-202).
by Scott Anthony Sikorski.
Ph.D.
202 leaves
10395562 bytes
10421642 bytes
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Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Measurement of adhesion using the island blister test
Thesis
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