2026-09-19T07:42:40Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/326822022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
James E. Chung, Carl V. Thompson II.
Yoon, Jung Uk, 1971-
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2006-05-15T20:21:35Z
2006-05-15T20:21:35Z
1995
1995
http://hdl.handle.net/1721.1/32682
34312002
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
Vita.
Includes bibliographical references (p. 47-49).
by Jung Uk Yoon.
M.S.
50 p.
2755706 bytes
2756265 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
SIMOX BOX metrology : using physical and electrical characterization
Thesis
application/pdf
Publication
unknown
unknown
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