<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T20:23:34Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/34761" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/34761</identifier><datestamp>2022-01-28T20:27:47Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Stephen Graves and Dimitris Bertsimas.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Kwong, William W. M</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Leaders for Manufacturing Program.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department" lang="en_US">Leaders for Manufacturing Program at MIT</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Sloan School of Management</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2006-11-08T16:33:46Z</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2004</dim:field>
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   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">56714339</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; in conjunction with the Leaders for Manufacturing Program at MIT, 2004.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (leaf 62).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Equipment management is an important driver behind operational efficiency, since capital equipment makes up about 40% of the average semiconductor manufacturer's total assets. The main goal of this project is to reduce variability in tool availability by planning for usage-driven preventive maintenance. A method and associated tools are proposed and investigated in the context of the Thin Films area in Intel's Hudson facility. The solution we propose incorporates the following characteristics: Drives towards a balanced preventive maintenance (PM) schedule such that PMs are evenly distributed in time; Enables fast recovery to a normal PM schedule after unexpected events occur on the factory floor, e.g. equipment breakdown, by re-distributing loads on each tool; Facilitates performance tracking and accountability; and Ensures consistency in the decision-making process. We will describe the conceptual method and the implementation process, from prototype deployment to the development of a production application. Alternative solutions using case-based reasoning and rule-based systems will also be discussed. We will conclude by discussing the role of automated decision systems in manufacturing and outline key issues to be considered in choosing an optimal design.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by William Kwong.</dim:field>
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   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
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   <dim:field mdschema="dc" element="subject" lang="en_US">Leaders for Manufacturing Program.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Reducing variability in equipment availability at Intel using systems optimization</dim:field>
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   	&lt;Title>Reducing variability in equipment availability at Intel using systems optimization&lt;/Title>
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   	&lt;Abstract>Equipment management is an important driver behind operational efficiency, since capital equipment makes up about 40% of the average semiconductor manufacturer&amp;apos;s total assets. The main goal of this project is to reduce variability in tool availability by planning for usage-driven preventive maintenance. A method and associated tools are proposed and investigated in the context of the Thin Films area in Intel&amp;apos;s Hudson facility. The solution we propose incorporates the following characteristics: Drives towards a balanced preventive maintenance (PM) schedule such that PMs are evenly distributed in time; Enables fast recovery to a normal PM schedule after unexpected events occur on the factory floor, e.g. equipment breakdown, by re-distributing loads on each tool; Facilitates performance tracking and accountability; and Ensures consistency in the decision-making process. We will describe the conceptual method and the implementation process, from prototype deployment to the development of a production application. Alternative solutions using case-based reasoning and rule-based systems will also be discussed. We will conclude by discussing the role of automated decision systems in manufacturing and outline key issues to be considered in choosing an optimal design.&lt;/Abstract>
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