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   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Roy E. Welsch and Thomas W. Eagar.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">González, Carlos A. (Carlos Alberto), 1972-</dim:field>
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   <dim:field mdschema="dc" element="contributor" qualifier="department" lang="en_US">Leaders for Manufacturing Program at MIT</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Mechanical Engineering</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Sloan School of Management</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2004</dim:field>
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   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">56714603</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2004.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 49).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">For this study, a novel wire inspection system was developed to detect surface defects and monitor diameter real-time during the final wire drawing operation. Throughout his work, it was proven that the new inspection system was able to catch common wire defects under manufacturing conditions (wire speed). Furthermore, defect density limits were defined based on data collected during this study. A production version of the wire inspection system was jointly developed with the equipment supplier and an order was placed for three complete systems to be installed in all final draw machines. Increased competition and poor economic conditions forced the manufacturer to place an unprecedented focus on decreasing manufacturing costs. The wire inspection system reported in this thesis was developed with the objective of increasing productivity at the most critical operation in the factory; final wire drawing.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Carlos A. González.</dim:field>
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   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
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   <dim:field mdschema="dc" element="title" lang="en_US">Addressing equipment set-up time and manufacturing cost through real time inline inspection in tantalum wire manufacturing</dim:field>
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   	&lt;Title>Addressing equipment set-up time and manufacturing cost through real time inline inspection in tantalum wire manufacturing&lt;/Title>
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   	&lt;PublicationDate>2004&lt;/PublicationDate>
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   	&lt;Abstract>For this study, a novel wire inspection system was developed to detect surface defects and monitor diameter real-time during the final wire drawing operation. Throughout his work, it was proven that the new inspection system was able to catch common wire defects under manufacturing conditions (wire speed). Furthermore, defect density limits were defined based on data collected during this study. A production version of the wire inspection system was jointly developed with the equipment supplier and an order was placed for three complete systems to be installed in all final draw machines. Increased competition and poor economic conditions forced the manufacturer to place an unprecedented focus on decreasing manufacturing costs. The wire inspection system reported in this thesis was developed with the objective of increasing productivity at the most critical operation in the factory; final wire drawing.&lt;/Abstract>
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