2026-09-19T11:03:12Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/360232022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
James Chung.
Zamdmer, Noah
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2007-02-21T11:05:42Z
2007-02-21T11:05:42Z
1994
1995
http://hdl.handle.net/1721.1/36023
32905984
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (leaves 81-82).
by Noah Zamdmer.
M.S.
82 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
Hot-electron degradation of bipolar transistors
Thesis
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