2026-09-19T10:11:38Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/365322022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
James E. Chung.
Chan, Vei-Han
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2007-03-12T17:28:22Z
2007-03-12T17:28:22Z
1995
1995
http://hdl.handle.net/1721.1/36532
32875610
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
Includes bibliographical references (p. 138-139).
by Vei-Han Chan.
Ph.D.
148 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
Hot-carrier reliability evaluation for CMOS devices and circuits
Thesis
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