2026-09-19T01:47:24Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/367552022-01-13T07:54:36Zcom_1721.1_7582com_1721.1_7581col_1721.1_131024
Kamal Youcef-Toumi.
Kesner, Samuel B. (Samuel Benjamin)
Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
Massachusetts Institute of Technology. Department of Mechanical Engineering
2007-03-12T17:50:45Z
2007-03-12T17:50:45Z
2006
2006
http://hdl.handle.net/1721.1/36755
78613459
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006.
Includes bibliographical references (p. 58-59).
The Atomic Force Microscope (AFM) is a powerful tool for the imaging of extremely small objects on the scale of nanometers, like carbon nanotubes and strands of DNA. There currently is a need for methods to actively steer the probe tip of the AFM in order to greatly reduce the time required to image certain samples. This paper proposes a tip steering method that utilizes the vertical feedback information from the AFM sensor as well as the dimensions of the sample object to determine and maintain a scanning trajectory. A comparison of similar trajectory tracking methods is also presented. The AFM system and operation is discussed in order to justify the tip steering method. Finally, the method proposed is successfully simulated with a DNA strand sample in the presence of measurement noise.
S.B.
70 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Mechanical Engineering.
Tip steering of the Atomic Force Microscope.
Tip steering of the AFM
Thesis
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Publication
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