<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T10:12:18Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/37081" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/37081</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Steven B. Leeb and Robert W. Cox.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Paris, James, Ph. D. Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2007-04-03T17:09:36Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2007-04-03T17:09:36Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2006</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2006</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/37081</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">83290088</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 259-260).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">The widespread use of electrical and electromechanical systems places increasing demands on monitoring and diagnostic techniques. The non-intrusive load monitor (NILM) provides a low-cost, low-maintenance way to perform this monitoring and diagnostics from a centralized location. This work critically evaluates the current state of the NILM hardware and software in order to develop new techniques and a new hardware and software framework in which to better apply the NILM to real-world systems. New diagnostic indicators are developed on the USCGC SENECA using an improved hardware and software platform. A database-driven framework with the flexibility to create and implement these and future diagnostic indicators is presented.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by James Paris.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">260 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">A framework for non-intrusive load monitoring and diagnostics</dim:field>
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   	&lt;Title>A framework for non-intrusive load monitoring and diagnostics&lt;/Title>
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   	&lt;PublicationDate>2006&lt;/PublicationDate>
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        	&lt;DisplayName>Paris, James, Ph. D. Massachusetts Institute of Technology&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>The widespread use of electrical and electromechanical systems places increasing demands on monitoring and diagnostic techniques. The non-intrusive load monitor (NILM) provides a low-cost, low-maintenance way to perform this monitoring and diagnostics from a centralized location. This work critically evaluates the current state of the NILM hardware and software in order to develop new techniques and a new hardware and software framework in which to better apply the NILM to real-world systems. New diagnostic indicators are developed on the USCGC SENECA using an improved hardware and software platform. A database-driven framework with the flexibility to create and implement these and future diagnostic indicators is presented.&lt;/Abstract>
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