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   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Duane Boning, Jeffrey A. Barks.</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">1995</dim:field>
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   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 87-89).</dim:field>
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   <dim:field mdschema="dc" element="title" lang="en_US">Applying run-by-run process control to chemical-mechanical planarization and assessing insertion costs versus benefits of CMP</dim:field>
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