<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T03:01:15Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/37849" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/37849</identifier><datestamp>2022-01-13T07:54:11Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Brian L. Wardle.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Chambers, Jeffrey Thomas</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Aeronautics and Astronautics.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Aeronautics and Astronautics</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2007-07-17T19:40:52Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2007-07-17T19:40:52Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2006</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2006</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/37849</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">137294987</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Aeronautics and Astronautics, 2006.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author.  The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (leaves 103-105).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Structural health monitoring (SHM) is an emerging technology leading to systems capable of continuously monitoring structures for damage. Aerospace structures have one of the highest payoffs for SHM systems because damage can lead to catastrophic and expensive failures. Prior work in SHM has focused on damage detection methods and sensor optimization, however, the topics of durability, reliability, and longevity of these systems has not been addressed. A framework for developing SHM durability test standards for aerospace vehicles is offered. Existing standards for the durability of commercial and military aircraft avionics are identified, and the relation to SHM systems is described. Using these existing standards, a test matrix and testing specifics are developed to assess the durability of SHM systems. Careful consideration is necessary in defining the 'system' under testing. Criteria are defined to establish whether a sensor/structural system has been affected by the various environments. Extensive experimental results from durability testing of a surface-mounted piezoelectric Lamb-wave SHM system are presented. Environments tested include temperature extremes, humidity, fluid susceptibility, altitude, and mechanical strain.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">(cont.) A voltage change criteria, which measures pre- vs. post-test sensed wave amplitude, proved useful in assessing the SHM system's performance. All sensors survived the tested environments, with an average voltage degradation of -16%. The high-temperature, humidity, and water-based fluids susceptibility tests had the greatest influence on the sensors, with an average voltage degradation of -38%. In several of the tests, the sensors had significant voltage degradation during environmental exposure, which recovered somewhat in most cases after ambient conditions were reestablished. A clear need exists for a supplemental standard geared specifically towards smart structure technologies that would address SHM and other embedded or surface mounted smart structure components and systems. Additional testing of the Lamb-wave sensors, including consideration of ultrasonic fatigue, is recommended.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Jeffrey Thomas Chambers.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">198 leaves</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Aeronautics and Astronautics.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Durability testing of an aircraft structural health monitoring system</dim:field>
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   	&lt;Title>Durability testing of an aircraft structural health monitoring system&lt;/Title>
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   	&lt;PublicationDate>2006&lt;/PublicationDate>
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        	&lt;DisplayName>Chambers, Jeffrey Thomas&lt;/DisplayName>
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    &lt;Keyword>Aeronautics and Astronautics.&lt;/Keyword>
   	&lt;Abstract>Structural health monitoring (SHM) is an emerging technology leading to systems capable of continuously monitoring structures for damage. Aerospace structures have one of the highest payoffs for SHM systems because damage can lead to catastrophic and expensive failures. Prior work in SHM has focused on damage detection methods and sensor optimization, however, the topics of durability, reliability, and longevity of these systems has not been addressed. A framework for developing SHM durability test standards for aerospace vehicles is offered. Existing standards for the durability of commercial and military aircraft avionics are identified, and the relation to SHM systems is described. Using these existing standards, a test matrix and testing specifics are developed to assess the durability of SHM systems. Careful consideration is necessary in defining the &amp;apos;system&amp;apos; under testing. Criteria are defined to establish whether a sensor/structural system has been affected by the various environments. Extensive experimental results from durability testing of a surface-mounted piezoelectric Lamb-wave SHM system are presented. Environments tested include temperature extremes, humidity, fluid susceptibility, altitude, and mechanical strain.&lt;/Abstract>
   	&lt;Abstract>(cont.) A voltage change criteria, which measures pre- vs. post-test sensed wave amplitude, proved useful in assessing the SHM system&amp;apos;s performance. All sensors survived the tested environments, with an average voltage degradation of -16%. The high-temperature, humidity, and water-based fluids susceptibility tests had the greatest influence on the sensors, with an average voltage degradation of -38%. In several of the tests, the sensors had significant voltage degradation during environmental exposure, which recovered somewhat in most cases after ambient conditions were reestablished. A clear need exists for a supplemental standard geared specifically towards smart structure technologies that would address SHM and other embedded or surface mounted smart structure components and systems. Additional testing of the Lamb-wave sensors, including consideration of ultrasonic fatigue, is recommended.&lt;/Abstract>
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