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Anantha P. Chandrakasan. Kwong, Joyce Y. S. (Joyce Yui Si) Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science 2007-07-18T13:14:00Z 2007-07-18T13:14:00Z 2006 2006 http://hdl.handle.net/1721.1/37947 144580435 Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006. Includes bibliographical references (p. 97-102). Sub-threshold operation is a compelling approach for energy-constrained applications where speed is of secondary concern, but increased sensitivity to process variation must be mitigated in this regime. With scaling of process technologies, random within-die variation has recently introduced another degree of complexity in circuit design. This thesis proposes approaches to mitigate process variation in sub-threshold circuits through device sizing, topology selection and fault-tolerant architecture. This thesis makes several contributions to a sub-threshold circuit design methodology. A formal analysis of device sizing trade-offs between delay, energy, and variability reveals that while minimum size devices provide lowest energy and delay in sub-threshold, their increased sensitivity to random dopant fluctuation may cause functional errors. A proposed variation-driven design approach enables consistent sizing of logic gates and registers for constant functional yield. A yield constraint imposes energy overhead at low power supply voltages and changes the minimum energy operating point of a circuit. (cont.) The optimal supply and device sizing depend on the topology of the circuit and its energy versus VDD characteristic. The analysis resulted in a 56-cell library in 65nm CMOS, which is incorporated in a computer-aided design flow. A test chip synthesized from this library implements a fault-tolerant FIR filter. Algorithmic error detection enables correction of transient timing errors due to delay variability in sub-threshold, and also allows the system frequency to be set more aggressively for the average case instead of the worst case. by Joyce Y.S. Kwong. S.M. 102 p. eng Massachusetts Institute of Technology M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 Electrical Engineering and Computer Science. A sub-threshold cell library and methodology Thesis application/pdf false Publication unknown unknown <Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="c2a84df6-2df3-4645-88ae-d0c71a9f71bf"> <Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type> <Language>eng</Language> <Title>A sub-threshold cell library and methodology</Title> <PublishedIn> <Publication> </Publication> </PublishedIn> <PublicationDate>2006</PublicationDate> <Authors> <Author> <DisplayName>Kwong, Joyce Y. S. (Joyce Yui Si)</DisplayName> <Affiliation> <OrgUnit> </OrgUnit> </Affiliation> </Author> </Authors> <Editors> </Editors> <Publishers> <Publisher> <DisplayName>Massachusetts Institute of Technology</DisplayName> <OrgUnit /> </Publisher> </Publishers> <License>http://dspace.mit.edu/handle/1721.1/7582</License> <Keyword>Electrical Engineering and Computer Science.</Keyword> <Abstract>Sub-threshold operation is a compelling approach for energy-constrained applications where speed is of secondary concern, but increased sensitivity to process variation must be mitigated in this regime. With scaling of process technologies, random within-die variation has recently introduced another degree of complexity in circuit design. This thesis proposes approaches to mitigate process variation in sub-threshold circuits through device sizing, topology selection and fault-tolerant architecture. This thesis makes several contributions to a sub-threshold circuit design methodology. A formal analysis of device sizing trade-offs between delay, energy, and variability reveals that while minimum size devices provide lowest energy and delay in sub-threshold, their increased sensitivity to random dopant fluctuation may cause functional errors. A proposed variation-driven design approach enables consistent sizing of logic gates and registers for constant functional yield. A yield constraint imposes energy overhead at low power supply voltages and changes the minimum energy operating point of a circuit.</Abstract> <Abstract>(cont.) The optimal supply and device sizing depend on the topology of the circuit and its energy versus VDD characteristic. The analysis resulted in a 56-cell library in 65nm CMOS, which is incorporated in a computer-aided design flow. A test chip synthesized from this library implements a fault-tolerant FIR filter. Algorithmic error detection enables correction of transient timing errors due to delay variability in sub-threshold, and also allows the system frequency to be set more aggressively for the average case instead of the worst case.</Abstract> <Access xmlns="http://purl.org/coar/access_right" > </Access> </Publication>