<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T17:25:39Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/40527" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/40527</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Anantha P. Chandrakasan and Jing Kong.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Pan, Tao, S.M. Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2008-02-27T22:43:22Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2008-02-27T22:43:22Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2007</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2007</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/40527</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">191911545</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 85-89).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Carbon nanotubes (CNTs) are nanometer-diameter cylinders formed from rolled-up graphene sheets which have found widespread interests due to their many excellent electrical properties. In particular, most of them are direct bandgap semiconductors from which carbon nanotube field effect transistors (CNTFETs) can be made. The small feature size and high electron mobility of the CNT makes it attractive and a good candidate to replace modern MOSFETs. So far, most fabricated CNTFETs conduct currents only on the order of microamps under low voltage bias which cannot be used to drive large output loads. In this work, we attempt to explore the ultimate performance benefits from utilizing multiple CNTs for CNTFETs. Two ways of making multi-tube CNTFETs are demonstrated in this thesis. Devices are fabricated, measured and analyzed. A simple model is used to evaluate the ideal ballistic behavior of CNTFETs. Parasitics that are measured from experiments and extracted from numerical tools are added to the model. As an application, we compare the performance of CNTFETs with MOSFETs, both used as power transistors in a Buck DC-DC converter circuit.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Tao Pan.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">89 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Carbon nanotube field effect transistors for power application</dim:field>
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   	&lt;Title>Carbon nanotube field effect transistors for power application&lt;/Title>
   	&lt;Subtitle>CNTFETs for power application&lt;/Subtitle>
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   	&lt;PublicationDate>2007&lt;/PublicationDate>
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        	&lt;DisplayName>Pan, Tao, S.M. Massachusetts Institute of Technology&lt;/DisplayName>
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   	&lt;Abstract>Carbon nanotubes (CNTs) are nanometer-diameter cylinders formed from rolled-up graphene sheets which have found widespread interests due to their many excellent electrical properties. In particular, most of them are direct bandgap semiconductors from which carbon nanotube field effect transistors (CNTFETs) can be made. The small feature size and high electron mobility of the CNT makes it attractive and a good candidate to replace modern MOSFETs. So far, most fabricated CNTFETs conduct currents only on the order of microamps under low voltage bias which cannot be used to drive large output loads. In this work, we attempt to explore the ultimate performance benefits from utilizing multiple CNTs for CNTFETs. Two ways of making multi-tube CNTFETs are demonstrated in this thesis. Devices are fabricated, measured and analyzed. A simple model is used to evaluate the ideal ballistic behavior of CNTFETs. Parasitics that are measured from experiments and extracted from numerical tools are added to the model. As an application, we compare the performance of CNTFETs with MOSFETs, both used as power transistors in a Buck DC-DC converter circuit.&lt;/Abstract>
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