2026-09-22T16:36:23Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/414142022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Subra Suresh.
Chu, Edison C. (Edison Chinghing)
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2008-04-23T14:56:57Z
2008-04-23T14:56:57Z
1996
1996
http://hdl.handle.net/1721.1/41414
36152095
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1996.
Includes bibliographical references (p. 89-94).
by Edison C. Chu.
M.S.
94 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
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http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Temperature-dependent yield properties of passivated aluminum thin films on silicon wafers
Thesis
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