2026-09-20T15:58:19Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/415822022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Charles G. Sodini.
Jayaraman, Rajsekhar
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2008-05-19T15:56:46Z
2008-05-19T15:56:46Z
1988
1988
http://hdl.handle.net/1721.1/41582
18969291
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.
Bibliography: leaves 164-178.
by Rajsekhar Jayaraman.
Ph.D.
193 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
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http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Reliability and 1/f noise properties of MOSFETs with nitrided oxide gate dielectrics
Thesis
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