2026-09-19T15:37:42Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/434462022-01-13T07:54:32Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Tom Eagar, Roy Welsch.
Bean, John W. (John Wellard)
Sloan School of Management
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2008-11-07T19:41:52Z
2008-11-07T19:41:52Z
1997
1997
http://hdl.handle.net/1721.1/43446
37863465
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1997, and Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1997.
Includes bibliographical references (p. 44).
by John W. Bean.
M.S.
52 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Sloan School of Management
Variation reduction in a wafer fabrication line through inspection optimization
Thesis
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