<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T23:12:18Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/44400" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/44400</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131022</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Hae-Seung Lee and Gregory Wornell.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Brooks, Lane Gearle, 1975-</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2009-01-30T16:42:01Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2009-01-30T16:42:01Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2008</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2008</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/44400</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">288990071</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">MIT Barker Engineering Library copy: printed in pages.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Also issued printed in pages.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (leaves 179-184).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Lane Gearle Brooks.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">Ph.D.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">184 leaves</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Circuits and algorithms for pipelined ADCs in scaled CMOS technologies</dim:field>
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   	&lt;Title>Circuits and algorithms for pipelined ADCs in scaled CMOS technologies&lt;/Title>
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   	&lt;PublicationDate>2008&lt;/PublicationDate>
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        	&lt;DisplayName>Brooks, Lane Gearle, 1975-&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.&lt;/Abstract>
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