<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T00:52:56Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/45982" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/45982</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Michael D. Ernst.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Glasser, David Samuel</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2009-06-30T16:54:43Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2009-06-30T16:54:43Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2007</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2007</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/45982</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">335013675</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 95-98).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Automated unit tests are essential for the construction of reliable software, but writing them can be tedious. If the goal of test generation is to create a lasting unit test suite (and not just to optimize execution of system tests), it is essential that generated tests can be understood by the developers that will be running them, so that they can tell the difference between real and spurious failures. amock is a system which automatically generates human-readable JUnit regression tests that use mock objects to simulate the behavior of individual objects dynamically observed during a system test execution.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by David Samuel Glasser.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">98 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Test factoring with amock: generating readable unit tests from system tests</dim:field>
   <dim:field mdschema="dc" element="type" lang="en_US">Thesis</dim:field>
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   	&lt;Title>Test factoring with amock: generating readable unit tests from system tests&lt;/Title>
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   	&lt;PublicationDate>2007&lt;/PublicationDate>
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        	&lt;DisplayName>Glasser, David Samuel&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>Automated unit tests are essential for the construction of reliable software, but writing them can be tedious. If the goal of test generation is to create a lasting unit test suite (and not just to optimize execution of system tests), it is essential that generated tests can be understood by the developers that will be running them, so that they can tell the difference between real and spurious failures. amock is a system which automatically generates human-readable JUnit regression tests that use mock objects to simulate the behavior of individual objects dynamically observed during a system test execution.&lt;/Abstract>
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