<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-20T01:59:04Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/46502" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/46502</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Andrew M. Siegel and James K. Roberge.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Steininger-Holmes, Jason Thomas</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2009-08-26T16:37:27Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2009-08-26T16:37:27Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2008</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2008</dim:field>
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   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">402680126</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 71-72).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">The test vehicle detector characterization system provides a convenient and efficient tool for rapidly evaluating the optical sensitivity of the GAP6012, GAP100, GAP300, and GAP1000 indium gallium arsenide detectors used on the vendor produced detector strips, which are used in the MARTI program at MIT Lincoln Laboratory. This characterization system exploits the approximately linear relationship between the radiant intensity of the gallium arsenide light emitting diodes (LEDs) and the forward current through the LEDs to correlate the expected irradiance with the observed detector counts. Illumination tests of different intensities are performed to characterize each detector's performance over its entire operating spectrum. Each test is performed multiple times to determine the statistical variance of each detector. A detector which exhibits a high statistical variance will not pass the qualifying stage. The results of these tests and others are saved and indexed by strip serial number; allowing for future reference if the need should arise. The system was developed in a modular fashion so as to be compatible with both the high power (HP) and low power (LP) detector strips with only minor hardware and firmware updates.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Jason Thomas Steininger-Holmes.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">72 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Test vehicle detector characterization system for the Boeing YAL-1 airborne laser</dim:field>
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   	&lt;Title>Test vehicle detector characterization system for the Boeing YAL-1 airborne laser&lt;/Title>
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   	&lt;PublicationDate>2008&lt;/PublicationDate>
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        	&lt;DisplayName>Steininger-Holmes, Jason Thomas&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>The test vehicle detector characterization system provides a convenient and efficient tool for rapidly evaluating the optical sensitivity of the GAP6012, GAP100, GAP300, and GAP1000 indium gallium arsenide detectors used on the vendor produced detector strips, which are used in the MARTI program at MIT Lincoln Laboratory. This characterization system exploits the approximately linear relationship between the radiant intensity of the gallium arsenide light emitting diodes (LEDs) and the forward current through the LEDs to correlate the expected irradiance with the observed detector counts. Illumination tests of different intensities are performed to characterize each detector&amp;apos;s performance over its entire operating spectrum. Each test is performed multiple times to determine the statistical variance of each detector. A detector which exhibits a high statistical variance will not pass the qualifying stage. The results of these tests and others are saved and indexed by strip serial number; allowing for future reference if the need should arise. The system was developed in a modular fashion so as to be compatible with both the high power (HP) and low power (LP) detector strips with only minor hardware and firmware updates.&lt;/Abstract>
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