2026-09-19T14:40:04Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/474352022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
James Chung.
Dao, Steve Gia, 1973-
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2009-10-01T15:10:58Z
2009-10-01T15:10:58Z
1998
1998
http://hdl.handle.net/1721.1/47435
39134657
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
Includes bibliographical references (leaves 98-100).
by Steve Gia Dao.
M.S.
100 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science
Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification
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