<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-18T23:56:00Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/53152" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/53152</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Jeffrey H. Lang and Bryan Johnson.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Machal-Cajigas, Antoinne Y</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2010-03-25T15:07:42Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2010-03-25T15:07:42Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2009</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2009</dim:field>
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   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">505599029</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 95-97).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Microelectromechanical systems known as MEMS, are an enabling technology that describe a field capable of creating very small electromechanical devices with feature sizes on the order of microns, or 10-6 meters. MEMS technology has received considerable attention recently as a way to produce switches. The technology leverages the fabrication instruments, processing and design techniques of the mature integrated circuit (IC) industry. While MEMS technology has shown great successes in producing commercial devices like accelerometers and pressure sensors, the same has not been true for switches. MEMS switches have shown great RF characteristics via low losses and high isolation. However, they possess several important shortcomings. At present, RF MEMS switches have low reliability, limited power handling capabilities, and slow switching times. Nonetheless, MEMS switches are poised to provide advantages over other switching technologies. The goal of this thesis is to understand the limits of their operation and predict their impact in practical applications. To that end, this thesis surveys the present state of the art of MEMS RF switches, identifies the benefits and drawbacks of switches created using this technology, and formulates predictions for the future of MEMS RF switches.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Antoinne Y. Machal-Cajigas.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">97 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
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   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">RF MEMS switches : survey and analysis</dim:field>
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   	&lt;Title>RF MEMS switches : survey and analysis&lt;/Title>
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   	&lt;PublicationDate>2009&lt;/PublicationDate>
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   	&lt;Abstract>Microelectromechanical systems known as MEMS, are an enabling technology that describe a field capable of creating very small electromechanical devices with feature sizes on the order of microns, or 10-6 meters. MEMS technology has received considerable attention recently as a way to produce switches. The technology leverages the fabrication instruments, processing and design techniques of the mature integrated circuit (IC) industry. While MEMS technology has shown great successes in producing commercial devices like accelerometers and pressure sensors, the same has not been true for switches. MEMS switches have shown great RF characteristics via low losses and high isolation. However, they possess several important shortcomings. At present, RF MEMS switches have low reliability, limited power handling capabilities, and slow switching times. Nonetheless, MEMS switches are poised to provide advantages over other switching technologies. The goal of this thesis is to understand the limits of their operation and predict their impact in practical applications. To that end, this thesis surveys the present state of the art of MEMS RF switches, identifies the benefits and drawbacks of switches created using this technology, and formulates predictions for the future of MEMS RF switches.&lt;/Abstract>
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