2026-09-19T17:46:46Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/531782022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Mehmet Fatih Yanik.
Putnam, William P
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2010-03-25T15:10:59Z
2010-03-25T15:10:59Z
2008
2008
http://hdl.handle.net/1721.1/53178
518081060
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.
Includes bibliographical references (p. 55-57).
In this thesis, the possibility of interaction-free quantum measurements with electrons is investigated. With a scheme based on existing charged particle trapping techniques, it is demonstrated that such interaction-free measurements are possible in the presence of previously measured quantum decoherence rates, and the efficiency of the measurement scheme and the absorption probability are estimated. Use of such interaction-free measurements with electrons in imaging applications could dramatically reduce sample damage induced by electron-exposure, which might allow non-destructive, molecular-resolution electron microscopy.
by William P. Putnam.
M.Eng.
57 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
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http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Non-destructive electron microscopy through interaction-free quantum measurement
Thesis
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