<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T08:24:23Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/61285" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/61285</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Randall Davis.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Felch, Kristen (Kristen M.)</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2011-02-23T14:41:47Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2011-02-23T14:41:47Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2010</dim:field>
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   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">702639074</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2010.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">"February 2010." Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 43).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">The Clock Drawing Test (CDT) is a medical test for neurodegenerative diseases that has been proven to have high diagnostic value due to its ease of administration and accurate results. In order to standardize the administration process and utilize the most current machine learning tools for analysis of CDT results, the digitizing pen has been used to computerize this diagnostic test. In order to successfully integrate digitizing pen technology with the CDT, a digit recognition algorithm was developed to reduce the need for manual classification of the data collected and maintain the ease of administration of the test. In addition, the Multitool Data Analysis Package was developed to aid in the exploratory data analysis stage of the CDT. This package combines several existing machine learning tools with two new algorithm implementations to provide an easy-to-use platform for discovering trends it CDT data.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Kristen Felch.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">iv, 69 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Integrating digitizing pen technology and machine learning with the Clock Drawing Test</dim:field>
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   	&lt;Title>Integrating digitizing pen technology and machine learning with the Clock Drawing Test&lt;/Title>
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   	&lt;PublicationDate>2010&lt;/PublicationDate>
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        	&lt;DisplayName>Felch, Kristen (Kristen M.)&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>The Clock Drawing Test (CDT) is a medical test for neurodegenerative diseases that has been proven to have high diagnostic value due to its ease of administration and accurate results. In order to standardize the administration process and utilize the most current machine learning tools for analysis of CDT results, the digitizing pen has been used to computerize this diagnostic test. In order to successfully integrate digitizing pen technology with the CDT, a digit recognition algorithm was developed to reduce the need for manual classification of the data collected and maintain the ease of administration of the test. In addition, the Multitool Data Analysis Package was developed to aid in the exploratory data analysis stage of the CDT. This package combines several existing machine learning tools with two new algorithm implementations to provide an easy-to-use platform for discovering trends it CDT data.&lt;/Abstract>
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