2026-09-19T21:31:45Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/659652022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Hae-Seung Lee.
Chu, Yue Jack
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2011-09-27T17:27:45Z
2011-09-27T17:27:45Z
2011
2011
http://hdl.handle.net/1721.1/65965
751864307
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2011.
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Cataloged from student submitted PDF version of thesis.
Includes bibliographical references (p. 133-137).
As CMOS processes continue to scale to smaller dimensions, the increased fT of the devices and smaller parasitic capacitance allow for more power ecient and faster digital circuits to be made. But at the same time, output impedance of transistors has gone down, as have the power supply voltages, and leakage currents have increased. These changes in the technology have made analog design more difficult. More specifically, the design of a high gain op-amp, a fundamental analog building block, has become more difficult in scaled processes. In this work, op-amps in pipelined ADCs are replaced with zero-crossing detectors(ZCD). Without the closed-loop feedback provided by the op-amp, a new set of design constraints for Zero-Crossing Based Circuits (ZCBC) is explored.
by Yue Jack Chu.
Ph.D.
157 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
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http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
High performance zero-crossing based pipelined analog-to-digtal converters
High performance zero-crossing based analog-to-digital converters
High performance zero-crossing based pipelined analog-to-digital converters
Thesis
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Publication
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<Title>High performance zero-crossing based pipelined analog-to-digtal converters</Title>
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<Abstract>As CMOS processes continue to scale to smaller dimensions, the increased fT of the devices and smaller parasitic capacitance allow for more power ecient and faster digital circuits to be made. But at the same time, output impedance of transistors has gone down, as have the power supply voltages, and leakage currents have increased. These changes in the technology have made analog design more difficult. More specifically, the design of a high gain op-amp, a fundamental analog building block, has become more difficult in scaled processes. In this work, op-amps in pipelined ADCs are replaced with zero-crossing detectors(ZCD). Without the closed-loop feedback provided by the op-amp, a new set of design constraints for Zero-Crossing Based Circuits (ZCBC) is explored.</Abstract>
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