2026-09-18T21:43:16Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/685492022-01-13T07:54:21Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Christian L. Degen.
Chang, Kevin Kai
Massachusetts Institute of Technology. Dept. of Chemistry.
Massachusetts Institute of Technology. Department of Chemistry
2012-01-12T19:36:32Z
2012-01-12T19:36:32Z
2011
2011
http://hdl.handle.net/1721.1/68549
771939029
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Chemistry, 2011.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 27).
The nitrogen-vacancy (N-V) center in diamonds have the potential to be an ultra-sensitive magnetic field sensor that is capable of detecting single spins. Implementing this sensor for general and nontransparent samples is not trivial. For N-V centers to be a useful probe, a way of positioning the NV center with nanometer accuracy while simultaneously measuring its fluorescence is needed. Here, a method of using N-V centers as magnetometer probes by combining this sensor with Atomic Force Microscopy (AFM) is described. A custom AFM was built that allows optical monitoring of the cantilever tip and collection of fluorescence with a high-NA objective from the same side. The AFM has a large open bottom and top and thus provides dual optical access. The motion of the cantilever is measured by optical beam deflection so that a wide range of commercial cantilevers can be used. The AFM and the confocal microscope objective can be locked in position while a piezoelectric stage allows raster scanning of the substrate.
by Kevin Kai Chang.
S.M.
27 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
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http://dspace.mit.edu/handle/1721.1/7582
Chemistry.
Custom built atomic force microscope for nitrogen-vacancy diamond magnetometry
Thesis
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<Abstract>The nitrogen-vacancy (N-V) center in diamonds have the potential to be an ultra-sensitive magnetic field sensor that is capable of detecting single spins. Implementing this sensor for general and nontransparent samples is not trivial. For N-V centers to be a useful probe, a way of positioning the NV center with nanometer accuracy while simultaneously measuring its fluorescence is needed. Here, a method of using N-V centers as magnetometer probes by combining this sensor with Atomic Force Microscopy (AFM) is described. A custom AFM was built that allows optical monitoring of the cantilever tip and collection of fluorescence with a high-NA objective from the same side. The AFM has a large open bottom and top and thus provides dual optical access. The motion of the cantilever is measured by optical beam deflection so that a wide range of commercial cantilevers can be used. The AFM and the confocal microscope objective can be locked in position while a piezoelectric stage allows raster scanning of the substrate.</Abstract>
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