<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-21T17:33:17Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/77027" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/77027</identifier><datestamp>2022-01-13T07:54:29Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Marc A. Baldo.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Mendoza, Hiroshi Antonio</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2013-02-14T15:39:52Z</dim:field>
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   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2011</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2012</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/77027</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">825786118</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, February 2012.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">"February 2011." Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 43-44).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">In this thesis the instruments explore two main aspects of organic optoelectronic devices. One instrument characterizes exciton diffusion and the other patterns organic thin films. Exciton diffusion characteristics are important to study in organic materials because excitons mediate the transport of energy. In this work, a fluorescence microscope is designed and built in order to image directly the triplet exciton diffusion in organic crystals. Patterning of organic thin films in industry is done by fine-metal masks, which are fragile and do not scale with substrate size. The second instrument is the first fully functional prototype for a new type of dry lithography technique invented in our research group which addresses the scalability and compatibility problems of past patterning methods. The proof-of-concept instrument replaces the traditional fine metal mask patterning method by patterning a sublimable mask with a micro-stamp.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Hiroshi Antonio Mendoza.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">M.Eng.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">44 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Design and construction of instruments for exciton diffusion characterization and for patterning of thin films</dim:field>
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   	&lt;Title>Design and construction of instruments for exciton diffusion characterization and for patterning of thin films&lt;/Title>
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   	&lt;PublicationDate>2012&lt;/PublicationDate>
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        	&lt;DisplayName>Mendoza, Hiroshi Antonio&lt;/DisplayName>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>In this thesis the instruments explore two main aspects of organic optoelectronic devices. One instrument characterizes exciton diffusion and the other patterns organic thin films. Exciton diffusion characteristics are important to study in organic materials because excitons mediate the transport of energy. In this work, a fluorescence microscope is designed and built in order to image directly the triplet exciton diffusion in organic crystals. Patterning of organic thin films in industry is done by fine-metal masks, which are fragile and do not scale with substrate size. The second instrument is the first fully functional prototype for a new type of dry lithography technique invented in our research group which addresses the scalability and compatibility problems of past patterning methods. The proof-of-concept instrument replaces the traditional fine metal mask patterning method by patterning a sublimable mask with a micro-stamp.&lt;/Abstract>
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