<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T11:35:19Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/78182" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/78182</identifier><datestamp>2022-01-13T07:54:36Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Gang Chen.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Hsu, Wei-Chun</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Mechanical Engineering.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Mechanical Engineering</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2013-03-28T18:11:56Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2013-03-28T18:11:56Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2012</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2012</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/78182</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">829815404</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 85-88).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Optical properties of micro/nano materials are important for many applications in biology, optoelectronics, and energy. In this thesis, a method is described to directly measure the quantitative absorptance spectra of micro/nano-sized structures using Fourier Transform Spectroscopy (FTS). The measurement technique combines optomechanical cantilever probes with a modulated broadband light source from an interferometer for spectroscopic measurements of objects. Previous studies have demonstrated the use of bilayer (or multi-layer) cantilevers as highly sensitive heat flux probes with the capability of resolving power as small as ~4 pW. Fourier Transform Spectroscopy is a well-established method to measure broadband spectra with significant advantages over conventional dispersive spectrometers such as a higher power throughput and large signal-to-noise ratio for a given measurement time. By integrating a bilayer cantilever probe with a Michelson interferometer, the new platform is capable of measuring broadband absorptance spectra from 3prm to 18pm directly and quantitatively with an enhanced sensitivity that enables the characterization of micro- and nanometer-sized samples, which cannot be achieved by using conventional spectroscopic techniques. Besides, a paralleled project of a bi-armed cantilever decouples the sample arm and the probe arm to further enhance the signal-to-noise ratio.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Wei-Chun Hsu.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">88 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Mechanical Engineering.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Direct and quantitative broadband absorptance micro/nano spectroscopy using FTIR and bilayer cantilever probes</dim:field>
   <dim:field mdschema="dc" element="title" qualifier="alternative" lang="en_US">Direct and quantitative broadband absorptance micro/nano spectroscopy using Fourier Transform Infrared Spectroscopy and bilayer cantilever probes</dim:field>
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   	&lt;Title>Direct and quantitative broadband absorptance micro/nano spectroscopy using FTIR and bilayer cantilever probes&lt;/Title>
   	&lt;Subtitle>Direct and quantitative broadband absorptance micro/nano spectroscopy using Fourier Transform Infrared Spectroscopy and bilayer cantilever probes&lt;/Subtitle>
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   	&lt;PublicationDate>2012&lt;/PublicationDate>
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        	&lt;DisplayName>Hsu, Wei-Chun&lt;/DisplayName>
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    &lt;Keyword>Mechanical Engineering.&lt;/Keyword>
   	&lt;Abstract>Optical properties of micro/nano materials are important for many applications in biology, optoelectronics, and energy. In this thesis, a method is described to directly measure the quantitative absorptance spectra of micro/nano-sized structures using Fourier Transform Spectroscopy (FTS). The measurement technique combines optomechanical cantilever probes with a modulated broadband light source from an interferometer for spectroscopic measurements of objects. Previous studies have demonstrated the use of bilayer (or multi-layer) cantilevers as highly sensitive heat flux probes with the capability of resolving power as small as ~4 pW. Fourier Transform Spectroscopy is a well-established method to measure broadband spectra with significant advantages over conventional dispersive spectrometers such as a higher power throughput and large signal-to-noise ratio for a given measurement time. By integrating a bilayer cantilever probe with a Michelson interferometer, the new platform is capable of measuring broadband absorptance spectra from 3prm to 18pm directly and quantitatively with an enhanced sensitivity that enables the characterization of micro- and nanometer-sized samples, which cannot be achieved by using conventional spectroscopic techniques. Besides, a paralleled project of a bi-armed cantilever decouples the sample arm and the probe arm to further enhance the signal-to-noise ratio.&lt;/Abstract>
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