<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-19T16:01:15Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/78197" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/78197</identifier><datestamp>2022-01-13T07:54:36Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Gang Chen.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Tong, Jonathan Kien-Kwok</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Dept. of Mechanical Engineering.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Mechanical Engineering</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2013-03-28T18:13:51Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2013-03-28T18:13:51Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2012</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2012</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/78197</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">830378223</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2012.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (p. 125-130).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Photonic nanostructures exhibit unique optical properties that are attractive in many different applications. However, measuring the optical properties of individual nanostructures, in particular the absorptive properties, remains a significant challenge. Conventional methods typically provide either an indirect or qualitative measure of absorption. The objective of this thesis is to therefore demonstrate a method capable of directly and quantitatively measuring the absorptive properties of individual nanostructures. This method is based on atomic force microscope (AFM) cantilever thermometry where a bimorph cantilever is used as a heat flux sensor. These sensors operate on the principle of a thermomechanical bending response and by virtue of their dimensionality, are capable of picowatt sensitivity. To validate the use of this technique, a single silicon nanowire is measured. By attaching a silicon nanowire to a cantilever and illuminating the sample with monochromatic light, the absolute absorptance spectrum of the nanowire was measured and shown to match well with theory. This spectroscopic technique can conceivably be used to measure even smaller samples, samples which cannot be characterized using conventional methods.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Jonathan Kien-Kwok Tong.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">130 p.</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by 
copyright. They may be viewed from this source for any purpose, but 
reproduction or distribution in any format is prohibited without written 
permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Mechanical Engineering.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Direct and quantitative absorptive spectroscopy of nanowires</dim:field>
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   	&lt;Title>Direct and quantitative absorptive spectroscopy of nanowires&lt;/Title>
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   	&lt;PublicationDate>2012&lt;/PublicationDate>
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        	&lt;DisplayName>Tong, Jonathan Kien-Kwok&lt;/DisplayName>
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    &lt;Keyword>Mechanical Engineering.&lt;/Keyword>
   	&lt;Abstract>Photonic nanostructures exhibit unique optical properties that are attractive in many different applications. However, measuring the optical properties of individual nanostructures, in particular the absorptive properties, remains a significant challenge. Conventional methods typically provide either an indirect or qualitative measure of absorption. The objective of this thesis is to therefore demonstrate a method capable of directly and quantitatively measuring the absorptive properties of individual nanostructures. This method is based on atomic force microscope (AFM) cantilever thermometry where a bimorph cantilever is used as a heat flux sensor. These sensors operate on the principle of a thermomechanical bending response and by virtue of their dimensionality, are capable of picowatt sensitivity. To validate the use of this technique, a single silicon nanowire is measured. By attaching a silicon nanowire to a cantilever and illuminating the sample with monochromatic light, the absolute absorptance spectrum of the nanowire was measured and shown to match well with theory. This spectroscopic technique can conceivably be used to measure even smaller samples, samples which cannot be characterized using conventional methods.&lt;/Abstract>
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