2026-09-20T11:00:10Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/842122022-01-13T07:54:01Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
James E. Chung and Paul J. Marcoux.
Le, Huy X. P
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2014-01-23T18:29:03Z
2014-01-23T18:29:03Z
1999
1999
http://hdl.handle.net/1721.1/84212
47078390
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
Includes bibliographical references (leaves 112-116).
by Huy X.P. Le.
Ph.D.
116 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
On the methodology of assessing hot-carrier reliability of analog circuits
Thesis
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