2026-09-19T04:56:28Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/844012022-01-13T07:54:05Zcom_1721.1_7582com_1721.1_7581col_1721.1_131024
Alexander H. Slocum.
Jarboe, Jason Neal
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Massachusetts Institute of Technology. Department of Mechanical Engineering
2014-01-23T18:41:40Z
2014-01-23T18:41:40Z
2013
http://hdl.handle.net/1721.1/84401
867866751
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2013.
Cataloged from PDF version of thesis.
Includes bibliographical references.
Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.
by Jason Neal Jarboe.
S.B.
72 pages
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Mechanical Engineering.
A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures
Thesis
application/pdf
false
Publication
unknown
unknown
<Publication xmlns="https://www.openaire.eu/cerif-profile/1.1/" id="a52dba07-e959-48df-b559-e4e778d9dd3d">
<Type xmlns="https://www.openaire.eu/cerif-profile/vocab/COAR_Publication_Types">http://purl.org/coar/resource_type/c_1843</Type>
<Language>eng</Language>
<Title>A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures</Title>
<PublishedIn>
<Publication>
</Publication>
</PublishedIn>
<PublicationDate>2013</PublicationDate>
<Authors>
<Author>
<DisplayName>Jarboe, Jason Neal</DisplayName>
<Affiliation>
<OrgUnit>
</OrgUnit>
</Affiliation>
</Author>
</Authors>
<Editors>
</Editors>
<Publishers>
<Publisher>
<DisplayName>Massachusetts Institute of Technology</DisplayName>
<OrgUnit />
</Publisher>
</Publishers>
<License>http://dspace.mit.edu/handle/1721.1/7582</License>
<Keyword>Mechanical Engineering.</Keyword>
<Abstract>Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.</Abstract>
<Access xmlns="http://purl.org/coar/access_right"
>
</Access>
</Publication>