2026-09-19T01:23:30Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/852492021-07-05T14:03:20Zcom_1721.1_7582com_1721.1_7581col_1721.1_131022
Carl V. Thompson.
Srikar, V. T. (Vengallatore Thattai), 1972-
Massachusetts Institute of Technology. Department of Materials Science and Engineering
2014-03-06T15:27:55Z
2014-03-06T15:27:55Z
1999
1999
http://hdl.handle.net/1721.1/85249
42620931
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1999.
Includes bibliographical references (leaves 103-108).
by V.T. Srikar.
Ph.D.
108 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Materials Science and Engineering
Electromigration behavior and reliability of bamboo Al(Cu) interconnects for integrated circuits
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