2026-09-19T08:32:42Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/864892022-01-13T07:54:01Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Srinivas Devadas.
Satish, Venkatesh, 1976-
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2014-05-07T16:44:44Z
2014-05-07T16:44:44Z
2000
2000
http://hdl.handle.net/1721.1/86489
46888270
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
Includes bibliographical references (leaves 63-64).
by Venkatesh Satish.
M.Eng.
65 leaves
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
An expert system to detect and diagnose failures in DRAM
Expert system to detect and diagnose failures in dynamic randon-access memory
Thesis
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