2026-09-20T11:14:58Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/878242022-01-13T07:54:01Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Hae-Seung Lee and Charles G. Sodini.
Sepke, Todd C. (Todd Christopher), 1975-
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2014-06-13T22:22:08Z
2014-06-13T22:22:08Z
2002
2002
http://hdl.handle.net/1721.1/87824
51490746
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2002.
MIT Institute Archives hard copy: p. 101-102 bound 102-101; p. 102 blank.
Includes bibliographical references (p. 97-101).
by Todd C. Sepke.
S.M.
111 p.
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Investigation of noise sources in scaled CMOS field-effect transistors
Investigation of noise sources in scaled complementary metal oxide semiconductors field-effect transistors
Thesis
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