2026-09-20T04:06:13Zhttps://dspace.mit.edu/server/oai/requestoai:dspace.mit.edu:1721.1/90982022-01-13T07:54:29Zcom_1721.1_7582com_1721.1_7581col_1721.1_131023
Akintunde I. Akinwande.
Wang, Belle Ewei, 1977-
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
2005-08-24T19:41:34Z
2005-08-24T19:41:34Z
2000
2000
http://hdl.handle.net/1721.1/9098
46989246
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
Includes bibliographical references (p. 81-84).
Although carbon nanotubes have been shown to be excellent field emitters, very little is known about the emission mechanism. This work strives to gain insight on field enhancement in films of single-walled carbon nanotubes by studying the internal field emission between the back contact metal and the nanotubes, and the external field emission between the nanotubes and vacuum. Test devices of different work functions were fabricated from platinum and from nickel / nickel oxide. Nickel oxide was deposited by e-beam evaporation or grown by thermal oxidation and characterized by Auger electron spectroscopy, x-ray diffraction and ellipsometry. Carbon nanotubes were deposited onto these test structures and current-voltage measurements were taken. Fowler-Nordheim plots were constructed from this data and analyzed. It was determined that external field emission was most likely to be responsible for electron emission.
by Belle Ewei Wang.
M.Eng.
84 p.
7259842 bytes
7259603 bytes
application/pdf
application/pdf
eng
Massachusetts Institute of Technology
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
http://dspace.mit.edu/handle/1721.1/7582
Electrical Engineering and Computer Science.
Field emission from carbon nanotubes deposited on platinum and nickel/nickel oxide multilayers
Thesis
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<Abstract>Although carbon nanotubes have been shown to be excellent field emitters, very little is known about the emission mechanism. This work strives to gain insight on field enhancement in films of single-walled carbon nanotubes by studying the internal field emission between the back contact metal and the nanotubes, and the external field emission between the nanotubes and vacuum. Test devices of different work functions were fabricated from platinum and from nickel / nickel oxide. Nickel oxide was deposited by e-beam evaporation or grown by thermal oxidation and characterized by Auger electron spectroscopy, x-ray diffraction and ellipsometry. Carbon nanotubes were deposited onto these test structures and current-voltage measurements were taken. Fowler-Nordheim plots were constructed from this data and analyzed. It was determined that external field emission was most likely to be responsible for electron emission.</Abstract>
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