<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-09-18T19:31:24Z</responseDate><request verb="GetRecord" identifier="oai:dspace.mit.edu:1721.1/92973" metadataPrefix="dim">https://dspace.mit.edu/server/oai/request</request><GetRecord><record><header><identifier>oai:dspace.mit.edu:1721.1/92973</identifier><datestamp>2022-01-13T07:54:01Z</datestamp><setSpec>com_1721.1_7582</setSpec><setSpec>com_1721.1_7581</setSpec><setSpec>col_1721.1_131023</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
   <dim:field mdschema="dc" element="contributor" qualifier="advisor" lang="en_US">Steven B. Leeb and Al-Thaddeus Avestruz.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="author" lang="en_US">Al Bastami, Anas Ibrahim</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="other" lang="en_US">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="contributor" qualifier="department">Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="accessioned">2015-01-20T15:31:23Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="available">2015-01-20T15:31:23Z</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="copyright" lang="en_US">2014</dim:field>
   <dim:field mdschema="dc" element="date" qualifier="issued" lang="en_US">2014</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="uri">http://hdl.handle.net/1721.1/92973</dim:field>
   <dim:field mdschema="dc" element="identifier" qualifier="oclc" lang="en_US">900011753</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2014.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">This electronic version was submitted by the student author.  The certified thesis is available in the Institute Archives and Special Collections.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Cataloged from student-submitted PDF version of thesis.</dim:field>
   <dim:field mdschema="dc" element="description" lang="en_US">Includes bibliographical references (pages 201-203).</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="abstract" lang="en_US">Power monitoring is needed in most electrical systems, and is crucial for ensuring reliability in everything from industrial and telecom applications, to automotive and consumer electronics. Power monitoring of integrated circuits (ICs) is also essential, as today ICs exist in most electrical and electronic systems, in a vast range of applications. Many ICs, including power ICs, have functional blocks across the chip that are used for different purposes. Measuring circuit block currents in both analog and digital ICs is important in a wide range of applications, including power management as well as IC testing and fault detection and analysis. For example, the presence of different kinds of faults in IC circuit blocks during IC fabrication causes the currents flowing through these circuit blocks to change from the expected values. There has been general interest in monitoring currents through different circuit blocks in an attempt to identify the location and type of the faults. Previous works on non intrusive load monitoring as well as on power-line communications (PLCs) provide motivation for the work presented here. The techniques are extended and used to develop a new method for power monitoring in ICs. Most solutions to the challenge of measuring currents in different circuit blocks of the IC involve adding circuitry that is both costly and power consuming. In this work, a new method is proposed to enable individual measurement of current consumed in each circuit block within an IC while adding negligible area and power overhead. This method works by encoding the individual current signatures in the main supply current of the IC, which can then be sensed and sampled off-chip, and then disaggregated through signal processing. A demonstration of this power monitoring scheme is given on a modular discrete platform that is implemented based on the UC3842 current-mode controller IC, which can also be used for educational purposes.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="statementofresponsibility" lang="en_US">by Anas Ibrahim Al Bastami.</dim:field>
   <dim:field mdschema="dc" element="description" qualifier="degree" lang="en_US">S.M.</dim:field>
   <dim:field mdschema="dc" element="format" qualifier="extent" lang="en_US">203 pages</dim:field>
   <dim:field mdschema="dc" element="language" qualifier="iso" lang="en_US">eng</dim:field>
   <dim:field mdschema="dc" element="publisher" lang="en_US">Massachusetts Institute of Technology</dim:field>
   <dim:field mdschema="dc" element="rights" lang="en_US">M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.</dim:field>
   <dim:field mdschema="dc" element="rights" qualifier="uri" lang="en_US">http://dspace.mit.edu/handle/1721.1/7582</dim:field>
   <dim:field mdschema="dc" element="subject" lang="en_US">Electrical Engineering and Computer Science.</dim:field>
   <dim:field mdschema="dc" element="title" lang="en_US">Power monitoring in integrated circuits</dim:field>
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   	&lt;Title>Power monitoring in integrated circuits&lt;/Title>
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   	&lt;PublicationDate>2014&lt;/PublicationDate>
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    &lt;Keyword>Electrical Engineering and Computer Science.&lt;/Keyword>
   	&lt;Abstract>Power monitoring is needed in most electrical systems, and is crucial for ensuring reliability in everything from industrial and telecom applications, to automotive and consumer electronics. Power monitoring of integrated circuits (ICs) is also essential, as today ICs exist in most electrical and electronic systems, in a vast range of applications. Many ICs, including power ICs, have functional blocks across the chip that are used for different purposes. Measuring circuit block currents in both analog and digital ICs is important in a wide range of applications, including power management as well as IC testing and fault detection and analysis. For example, the presence of different kinds of faults in IC circuit blocks during IC fabrication causes the currents flowing through these circuit blocks to change from the expected values. There has been general interest in monitoring currents through different circuit blocks in an attempt to identify the location and type of the faults. Previous works on non intrusive load monitoring as well as on power-line communications (PLCs) provide motivation for the work presented here. The techniques are extended and used to develop a new method for power monitoring in ICs. Most solutions to the challenge of measuring currents in different circuit blocks of the IC involve adding circuitry that is both costly and power consuming. In this work, a new method is proposed to enable individual measurement of current consumed in each circuit block within an IC while adding negligible area and power overhead. This method works by encoding the individual current signatures in the main supply current of the IC, which can then be sensed and sampled off-chip, and then disaggregated through signal processing. A demonstration of this power monitoring scheme is given on a modular discrete platform that is implemented based on the UC3842 current-mode controller IC, which can also be used for educational purposes.&lt;/Abstract>
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